NO-JIRA Speeding-up I/O paging for tests
This commit is contained in:
parent
63577c7264
commit
4a677d01f0
|
@ -137,7 +137,7 @@ public class PagingStoreImplTest extends ActiveMQTestBase {
|
|||
@Test
|
||||
public void testPageWithNIO() throws Exception {
|
||||
ActiveMQTestBase.recreateDirectory(getTestDir());
|
||||
testConcurrentPaging(new NIOSequentialFileFactory(new File(getTestDir()), 1), 1);
|
||||
testConcurrentPaging(new NIOSequentialFileFactory(new File(getTestDir()), 1).setDatasync(false), 1);
|
||||
}
|
||||
|
||||
@Test
|
||||
|
@ -589,7 +589,7 @@ public class PagingStoreImplTest extends ActiveMQTestBase {
|
|||
@Test
|
||||
public void testRestartPage() throws Throwable {
|
||||
clearDataRecreateServerDirs();
|
||||
SequentialFileFactory factory = new NIOSequentialFileFactory(new File(getPageDir()), 1);
|
||||
SequentialFileFactory factory = new NIOSequentialFileFactory(new File(getPageDir()), 1).setDatasync(false);
|
||||
|
||||
PagingStoreFactory storeFactory = new FakeStoreFactory(factory);
|
||||
|
||||
|
@ -620,7 +620,7 @@ public class PagingStoreImplTest extends ActiveMQTestBase {
|
|||
@Test
|
||||
public void testOrderOnPaging() throws Throwable {
|
||||
clearDataRecreateServerDirs();
|
||||
SequentialFileFactory factory = new NIOSequentialFileFactory(new File(getPageDir()), 1);
|
||||
SequentialFileFactory factory = new NIOSequentialFileFactory(new File(getPageDir()), 1).setDatasync(false);
|
||||
|
||||
PagingStoreFactory storeFactory = new FakeStoreFactory(factory);
|
||||
|
||||
|
@ -739,7 +739,7 @@ public class PagingStoreImplTest extends ActiveMQTestBase {
|
|||
@Test
|
||||
public void testWriteIncompletePage() throws Exception {
|
||||
clearDataRecreateServerDirs();
|
||||
SequentialFileFactory factory = new NIOSequentialFileFactory(new File(getPageDir()), 1);
|
||||
SequentialFileFactory factory = new NIOSequentialFileFactory(new File(getPageDir()), 1).setDatasync(false);
|
||||
|
||||
PagingStoreFactory storeFactory = new FakeStoreFactory(factory);
|
||||
|
||||
|
|
Loading…
Reference in New Issue