HBASE-24167 [Flakey Tests] TestHRegionWithInMemoryFlush#testWritesWhileScanning gets stuck MVCC
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@ -3826,6 +3826,20 @@ public class TestHRegion {
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}
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}
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/**
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* So can be overridden in subclasses.
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*/
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int getNumQualifiersForTestWritesWhileScanning() {
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return 100;
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}
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/**
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* So can be overridden in subclasses.
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*/
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int getTestCountForTestWritesWhileScanning() {
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return 100;
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}
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/**
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* Writes very wide records and scans for the latest every time.. Flushes and
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* compacts the region every now and then to keep things realistic.
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@ -3837,10 +3851,10 @@ public class TestHRegion {
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*/
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@Test
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public void testWritesWhileScanning() throws IOException, InterruptedException {
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int testCount = 100;
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int testCount = getTestCountForTestWritesWhileScanning();
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int numRows = 1;
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int numFamilies = 10;
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int numQualifiers = 100;
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int numQualifiers = getNumQualifiersForTestWritesWhileScanning();
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int flushInterval = 7;
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int compactInterval = 5 * flushInterval;
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byte[][] families = new byte[numFamilies][];
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@ -61,6 +61,17 @@ public class TestHRegionWithInMemoryFlush extends TestHRegion {
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isReadOnly, durability, wal, inMemory, families);
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}
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@Override int getTestCountForTestWritesWhileScanning() {
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return 10;
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}
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/**
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* testWritesWhileScanning is flakey when called out of this class. Need to dig in. Meantime
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* go easy on it. See if that helps.
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*/
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@Override int getNumQualifiersForTestWritesWhileScanning() {
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return 10;
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}
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/**
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* A test case of HBASE-21041
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