LUCENE-5272: fix test bugs

git-svn-id: https://svn.apache.org/repos/asf/lucene/dev/trunk@1532161 13f79535-47bb-0310-9956-ffa450edef68
This commit is contained in:
Robert Muir 2013-10-15 01:52:23 +00:00
parent 89c83b40d3
commit 9e258d224d
1 changed files with 1 additions and 1 deletions

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@ -349,7 +349,7 @@ public class TestOpenBitSet extends BaseDocIdSetTestCase<OpenBitSet> {
// test ensureCapacityWords
int numWords = random().nextInt(10) + 2; // make sure we grow the array (at least 128 bits)
bits.ensureCapacityWords(numWords);
bit = _TestUtil.nextInt(random(), 128, numWords << 6); // pick a higher bit than 128, but still within range
bit = _TestUtil.nextInt(random(), 127, (numWords << 6)-1); // pick a bit >= to 128, but still within range
bits.fastSet(bit);
assertTrue(bits.fastGet(bit));
bits.fastClear(bit);