Fix test bug: over-allocation that causes an OOME.

git-svn-id: https://svn.apache.org/repos/asf/lucene/dev/trunk@1404451 13f79535-47bb-0310-9956-ffa450edef68
This commit is contained in:
Adrien Grand 2012-11-01 02:17:24 +00:00
parent fcee466184
commit bc80485d65
1 changed files with 1 additions and 1 deletions

View File

@ -313,7 +313,7 @@ public class TestCompressingStoredFieldsFormat extends LuceneTestCase {
onlyStored.setIndexed(false);
final Field smallField = new Field("fld", randomByteArray(random().nextInt(10), 256), onlyStored);
final int numFields = atLeast(1000000);
final int numFields = RandomInts.randomIntBetween(random(), 500000, 1000000);
for (int i = 0; i < numFields; ++i) {
bigDoc1.add(smallField);
}