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improve test debuggability 

git-svn-id: https://svn.apache.org/repos/asf/lucene/dev/trunk@1624108 13f79535-47bb-0310-9956-ffa450edef68
This commit is contained in:
Michael McCandless 2014-09-10 20:16:34 +00:00
parent 8704af45b1
commit e383c21c68
1 changed files with 2 additions and 0 deletions
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2
lucene/core/src/test/org/apache/lucene/index/TestIndexWriter.java
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@ -1087,6 +1087,7 @@ public class TestIndexWriter extends LuceneTestCase {
}
IndexWriterConfig conf = newIndexWriterConfig(random,
new MockAnalyzer(random)).setMaxBufferedDocs(2);
conf.setInfoStream(log);
w = new IndexWriter(dir, conf);
Document doc = new Document();
@ -1102,6 +1103,7 @@ public class TestIndexWriter extends LuceneTestCase {
doc.add(sortedDVField);
doc.add(sortedSetDVField);
for(int i=0;i<100;i++) {
log.println("\nTEST: i=" + i);
idField.setStringValue(Integer.toString(i));
binaryDVField.setBytesValue(new BytesRef(idField.stringValue()));
numericDVField.setLongValue(i);