From e8ec44a92339f4b03eec4c25206ef07259cca785 Mon Sep 17 00:00:00 2001 From: Michael McCandless Date: Sun, 9 Dec 2012 20:06:38 +0000 Subject: [PATCH] fix typo: Samping -> Sampling git-svn-id: https://svn.apache.org/repos/asf/lucene/dev/trunk@1419123 13f79535-47bb-0310-9956-ffa450edef68 --- .../org/apache/lucene/facet/search/sampling/SamplingParams.java | 2 +- .../apache/lucene/facet/search/sampling/BaseSampleTestTopK.java | 2 +- .../lucene/facet/search/sampling/OversampleWithDepthTest.java | 2 +- 3 files changed, 3 insertions(+), 3 deletions(-) diff --git a/lucene/facet/src/java/org/apache/lucene/facet/search/sampling/SamplingParams.java b/lucene/facet/src/java/org/apache/lucene/facet/search/sampling/SamplingParams.java index 3687e0b699b..fc509ca11ec 100644 --- a/lucene/facet/src/java/org/apache/lucene/facet/search/sampling/SamplingParams.java +++ b/lucene/facet/src/java/org/apache/lucene/facet/search/sampling/SamplingParams.java @@ -125,7 +125,7 @@ public class SamplingParams { * Set a sampling-threshold * @see #getSamplingThreshold() */ - public void setSampingThreshold(int samplingThreshold) { + public void setSamplingThreshold(int samplingThreshold) { this.samplingThreshold = samplingThreshold; } diff --git a/lucene/facet/src/test/org/apache/lucene/facet/search/sampling/BaseSampleTestTopK.java b/lucene/facet/src/test/org/apache/lucene/facet/search/sampling/BaseSampleTestTopK.java index 4382029bbbc..008e8ab75cb 100644 --- a/lucene/facet/src/test/org/apache/lucene/facet/search/sampling/BaseSampleTestTopK.java +++ b/lucene/facet/src/test/org/apache/lucene/facet/search/sampling/BaseSampleTestTopK.java @@ -145,7 +145,7 @@ public abstract class BaseSampleTestTopK extends BaseTestTopK { samplingParams.setMaxSampleSize((int) (10000 * retryFactor)); samplingParams.setOversampleFactor(5.0 * retryFactor); - samplingParams.setSampingThreshold(11000); //force sampling + samplingParams.setSamplingThreshold(11000); //force sampling Sampler sampler = useRandomSampler ? new RandomSampler(samplingParams, new Random(random().nextLong())) : new RepeatableSampler(samplingParams); diff --git a/lucene/facet/src/test/org/apache/lucene/facet/search/sampling/OversampleWithDepthTest.java b/lucene/facet/src/test/org/apache/lucene/facet/search/sampling/OversampleWithDepthTest.java index 15ea4842ea9..e82e46769ee 100644 --- a/lucene/facet/src/test/org/apache/lucene/facet/search/sampling/OversampleWithDepthTest.java +++ b/lucene/facet/src/test/org/apache/lucene/facet/search/sampling/OversampleWithDepthTest.java @@ -77,7 +77,7 @@ public class OversampleWithDepthTest extends LuceneTestCase { params.setMinSampleSize(2); params.setMaxSampleSize(50); params.setOversampleFactor(5); - params.setSampingThreshold(60); + params.setSamplingThreshold(60); params.setSampleRatio(0.1); FacetResult res = searchWithFacets(r, tr, fsp, params);